As to the 1950's and 1960's nuclear tests in space (there were nine space tests I believe)...the types of components used in those years, both military and civilian, were not as suceptable to EMP damage as the discrete electronic compoinents we have come to abjectly rely on today. That is one reason why the impact back then was much more minimal than what it would be today.
..the types of components used in those years, both military and civilian, were not as suceptable to EMP damage as the discrete electronic compoinents we have come to abjectly rely on today.Today's micro-electronics input/output pins are, however, protected intrinsic ESD circuity; typically fast clamping diodes to ground and the Vcc or Vdd supply rails ... this works surprising well in practice AND is an under-rated factor in most 'predictions' performed by arm-chair EMP analysts ...