The SEMS I’ve showns you made with a siliconized solution look like the Daschle product. That’s your signature.
That SEM wouldn’t explain why Detrick would see fried egg gunk and then call AFIP to ask them to perform EDX on the extraneous material that they see.
They might send it to AFIP and say: “can you run the EDX to see if there’s any unusual elements” - but they wouldn’t specifically say “we’ve SEEN something unusual in the SEM, can you run EDX and identify it?”