More publications:
| SPECIAL ISSUE ON SYSTEM-LEVEL INTERCONNECT PREDICTION (SLIP) - REGULAR SECTION TRANSACTIONS BRIEFS - Partitioning Algorithm to Enhance Pseudoexhaustive Testing of Digital VLSI Circuits Author: Shaer, B; Landis, D; Al-Arian, S A Source: IEEE transactions on very large scale integration (VLSI) systems. 8, no. 6, (2000): 750 (5 pages) |
| REGULAR SECTION PAPERS - Partitioning Sequential Circuits for Pseudoexhaustive Testing Author: Shaer, B; Al-Arian, S A; Landis, D Source: IEEE transactions on very large scale integration (VLSI) systems. 8, no. 5, (2000): 534 (8 pages) |
| A statistical methodology for modeling and analysis of path delay faults in VLSI circuits Author: Hamad, M; Al-Arian, S; Landis, D Source: Computers & electrical engineering. 23, no. 5, (1997): 319 (10 pages) |
| A Method for Consistent Fault Coverage Reporting. Author: Debany, Warren H. Jr.; Kwiat, Kevin A.; Al-Arian, Sami A. Source: IEEE design & test of computers / 10, no. 3, (September 1993): 68-79 |
| Pseudo-Exhaustive Testing of Sequential Circuits Author: Shaer, B. Al-Arian, S. A. Landis, D. Year: 1999 |
| A New Heuristic Algorithm for Estimating Signal and Detection Probabilities Author: Al-Kharji, M. Al-Arian, S. Year: 1997 |
| A Novel Built-in Current Sensor for IDDQ Testing of Deep Submicron CMOS ICs Author: Athan, S. P. Landis, D. L. Al-Arian, S. A. Year: 1996 |
| Testing and Simulation of Degrading Faults Author: Abujbara, H. Al-Arian, S. A. Year: 1994 |
| Degrading Fault Model for WSI Interconnection Lines Author: Abujbara, H. Al-Arian, S. Year: 1993 |
| Improving the Testability of VLSI Circuits through Partitioning Author: Al-Arian, S. A. Bolling, R. E. Year: 1994 |
Voice switch performance on speech signals /
Author: Al-Arian, Sami A., 1958-
Publication: Raleigh : North Carolina State University, 1980
Document: English :